Multipurpose Measuring Instruments: Nano Profile Scanner NPS2100A

NPS2100A

Nano Profile Scanner NPS2100A

The Probe Tip Diameter of the Tens of Nanometers Scans the Workpiece Surface to Display Irregularities in 3D with Nanometer Level Resolution.
Features1:
Nanometer level profile evaluation
Features2:
Unique self detecting cantilever - easy to install and operate, portable anywhere for measurements.
Features3:
The provision of a vibration isolation mechanism that consistes of a coil spring and gel damper allows measurements to be performed a tvertually any location.
Features4:
High efficiency measurement of 12 seconds to 1800 seconds per frame is realized. The scanned profile can be monitored during measurement.